학술저널
전기전자 시스템 신뢰성 예측 방법론 217Plus™의 개요
Overview of the 217Plus™, electronic system reliability prediction methodology
- 강원대학교 산업기술연구소
- 산업기술연구
- vol.28
-
2008.09215 - 226 (12 pages)
- 30
MIL-HDBK-217 has widely been used for electronics reliability predictions. Recently, the 217Plus™ has been developed by DoD RIAC and may replace MIL-HDBK-217. A overview of the 217P1us™ has been performed in this paper. We first reviewed the overall concepts and reliability prediction procedures. We then explained the component models and the system level model with process grading concepts. Bayesian approach incorporating field data into the predicted failure rate is another feature of this methodology.
Abstract
1. 서론
2. 217 Plus의 신뢰도 예측 절차
3. 부품모형 (Component Models)
4. 시스템 신뢰도 예측 모형과 방법론
5. 경험에 의한 고장률 통합
6. 결론
참고문헌
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