진단영역 X선 에너지에서 유리선량계, 반도체선량계, 면적선량계의 선량 실측 비교

Comparison of Dose Measurement of Glass Dose Meter, Semiconductor Dose Meter, and Area Dose Meter in Diagnostic X-ray Energy

This paper obtained and compared these dose values by setting and comparing the X-ray imaging conditions (tube voltage 60 kVp, 70 kVp, 80 kVp, tube current 10 mAs, 16 mAs and X-ray field size are 10 × 10 cm, 15 × 15 cm). Each dose value was measure 10 times and represented as an average value. The purpose of this experiment is to serve as a reference for the X-ray exposure of diagnostic areas according to the type of dosimeter and to help with another dose measurement. The results of the experiment showed very little difference between the glass dosimeter(GD) and semiconductor dosimeter values due to changes in tube voltage of 60, 70, 80 kVp, regardless of field sized, but for dose area product(DAP), the difference in dose value was significant according to field size.