Optimal M-level Constant Stress Design with a Polynomial Stress Model for Weibull Distribution

Most of the accelerated life tests deal with tests that use only one accelerating variable and no other explanatory variables. Frequently, however, there is a test to use more than one accelerating or other experimental variables, such as, for examples, a test of capacitors at higher than usual conditions of temperature and voltage, a test of circuit boards at higher than usual conditions of temperature, humidity and voltage. In this paper, a accelerated life test is extended to M-level stress accelerated life test with a polynomial stress model. The optimal design for Weibull distribution is studied with a polynomial stress model.