*KCI등재*

*학술저널*

#
*Optimal M-level Constant Stress Design with a Polynomial Stress Model for Weibull Distribution*

- Gyoung-Ae Moon
- 한국자료분석학회
- Journal of The Korean Data Analysis Society (JKDAS)
- Vol.6 No.6
- 등재여부 : KCI등재
- 2004.12
- 1521 - 1529 (9 pages)

Most of the accelerated life tests deal with tests that use only one accelerating variable and no other explanatory variables. Frequently, however, there is a test to use more than one accelerating or other experimental variables, such as, for examples, a test of capacitors at higher than usual conditions of temperature and voltage, a test of circuit boards at higher than usual conditions of temperature, humidity and voltage. In this paper, a accelerated life test is extended to M-level stress accelerated life test with a polynomial stress model. The optimal design for Weibull distribution is studied with a polynomial stress model.

1. Introduction

2. Optimal M-level constant stress design

3. Numerical Examples

References