Bayesian Inference of Three-parameter Exponentiated Weibull Distribution Based on Progressive Type-II Censoring

Three-parameter exponentiated weibull distribution introduced by Mudholkar, Srivastava (1993) is a more realistic model for an analysis of life time test than the model with monotone failure rates. We consider the Bayesian inference of the lifetime models. These problems arise when the machine tool should be replaced or industrial process should be changed in tile field of engineering and the provision of warranty limits for the future performance of a specified number of systems. Based on progressive type-II censored sampling which is an important method of obtaining failure data in lifetime study, Bayesian estimations from the three-parameter exponentiated weibull distributions are studied, using the proper general prior density. A numerical simulate using Monte Carlo method is provided.