CZT 반도체 검출기를 활용한 중성자 및 감마선 측정과 분석 기술에 관한 연구

A Study on the Technology of Measuring and Analyzing Neutrons and Gamma-Rays Using a CZT Semiconductor Detector

CZT detectors, which are compound semiconductors that have been widely used recently for gamma-ray detection purposes, are difficult to detect neutrons because direct interaction with them does not occur unlike gamma-rays. In this paper, a method of detecting and determining energy levels (fast neutrons and thermal neutrons) of neutrons, in addition of identifying energy and nuclide of gamma-rays, and evaluating gamma dose rates using a CZT semiconductor detector is described. Neutrons may be detected by a secondary photoelectric effect or compton scattering process with a characteristic gamma-ray of 558.6 keV generated by a capture reaction (113Cd + 1 n → 114Cd + γ) with cadmium (Cd) in the CZT detector. However, in the case of fast neutrons, the probability of capture reaction with cadmium (Cd) is very low, so it must be moderated to thermal neutrons using a moderator and the material and thickness of moderator should be determined in consideration of the portability and detection efficiency of the equipment. Conversely, in the case of thermal neutrons, the detection efficiency decreases due to shielding effect of moderator itself, so additional CZT detector that do not contain moderator must be configured. The CZT detector that does not contain moderator can be used to evaluate energy, nuclide, and gamma dose-rate for gamma-rays. The technology proposed in this paper provides a method for detecting both neutrons and gamma-rays using a CZT detector.