Effects of Asymmetric Distribution of Charged Defects on the Hysteresis Curves of Ferroelectric Capacitors
Effects of Asymmetric Distribution of Charged Defects on the Hysteresis Curves of Ferroelectric Capacitors
- 한국마이크로전자및패키징학회
- 마이크로전자 및 패키징학회지
- 제12권 제3호
- : KCI등재후보
- 2005.09
- 219 - 226 (8 pages)
When a ferroelectric film has an inhomogeneous distribution of charged defects, a voltage shift in the polarization curve is induced by the internal field generated in the film. The direction and the magnitude of voltage shift in the P-V hysteresis curves obtained by the Sawyer-Tower method are different from those obtained by the virtual ground method. In this study, the asymmetric behavior in the P-V hysteresis curves of inhomogeneous ferroelectric films was investigated with a physical model and the polarization curves obtained by the Sawyer-Tower and the virtual ground methods are compared.
1. Introduction
2. Modeling of P-v Cure
3. Results and Discussion
4. Conclusion
Acknowledgement
References