Direct Solid Sample Analysis in the Moderate Power He Mip with the Spark Generation

Direct Solid Sample Analysis in the Moderate Power He Mip with the Spark Generation

Conducting solid samples are successfully analyzed with the spark ablation combined to the moderate power (500W) Helium Microwave Induced Plasma (He MIP). The relative standard deviations are in the range of 3-10% and the detection limits are around 50 ${\mu}$g $g^-1$. These values are higher than those of Ar MIP or Ar Inductively Coupled Plasma. Spark ablated particles are examined to investigate the analytical characteristics of the system.

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