국가지식-학술정보
Accelerated Soft Error Rate Study with Well Structures
Accelerated Soft Error Rate Study with Well Structures
- 대한전기학회
- KIEE International Transactions on Electrophysics and Applications
- Vol.3C No.1
-
2003.0115 - 18 (4 pages)
- 0
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The characteristics of accelerated soft error rate (ASER) for fabricated 8M SRAM are evaluated for various well structures. The application of the Buried NWell (BNW) and the variations of each well structure, well dose in process conditions are checked by ASER failure in time (FIT) in terms of reliability. The application of only the BNW shows the lowest ASER FIT value. The BNW added to the Buried PWell (BPW) shows a 200% increase and the BNW plus the Striped BPW (SBPW) shows a 100% increase compared to applying the BNW. The cases of applying SBPW show very high ASER FIT.
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