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Electromagnetic Susceptibility Analysis of I/O Buffers Using the Bulk Current Injection Method
Electromagnetic Susceptibility Analysis of I/O Buffers Using the Bulk Current Injection Method
- 대한전자공학회
- JSTS:Journal of Semiconductor Technology and Science
- Vol.13 No.2
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2013.01114 - 126 (13 pages)
- 0
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In this paper, we present a set of methodologies to model the electromagnetic susceptibility (EMS) testing of I/O buffers for mobile system memory based on the bulk current injection (BCI) method. An efficient equivalent circuit model is developed for the current injection probe, line impedance stabilization network (LISN), printed circuit board (PCB), and package. The simulation results show good correlation with the measurements and thus, the work presented here will enable electromagnetic susceptibility analysis at the integrated circuit (IC) design stage.
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