Frequency-Distance Responses in SECM-EQCM: A Novel Method for Calibration of the Tip-Sample Distance<TEX>$S$</TEX>

The frequency response on the tip-sample distance in scanning electrochemical microscopy (SECM) that is combined with an electrochemical quartz crystal microbalance (EQCM) is described. The oscillation frequency of the EQCM increases rapidly when the SECM tip is very close to the substrate electrode surface. This frequency increase is reproducible regardless of the current feedback in SECM, which is attributed to the stress caused by the tip pressing the quartz crystal. It is useful to calibrate the tip-sample distance with respect to the frequency change when a combined system of SECM and EQCM (SECM-EQCM) is used. This method could be applied to several cases such as rigid metal electrode and non-conducting or partially conducting polymer coating prepared on the quartz crystal regardless of the feedback current.