Growth and White Light Emission of Nano-fibrous ZnO Thin Films on Porous Silicon

Growth and White Light Emission of Nano-fibrous ZnO Thin Films on Porous Silicon

Nano-fibrous ZnO thin films were grown on porous silicon (PS) by sol-gel spin-coating method. Atomic force microscopy, X-ray diffraction, Raman, and photoluminescence were carried out to investigate the structural and optical properties of the nanofibrous ZnO thin films. When the nano-fibrous thin films were grown on PS, their residual stress could be reduced, and the full width at half maximum (FWHM) of the ZnO (002) diffraction peak and near-band-edge emission (NBE) peak were decreased, indicating that the optical as well as the structural properties were enhanced. Furthemore, white light emission was observed from nano-fibrous ZnO thin films grown on PS.

Nano-fibrous ZnO thin films were grown on porous silicon (PS) by sol-gel spin-coating method. Atomic force microscopy, X-ray diffraction, Raman, and photoluminescence were carried out to investigate the structural and optical properties of the nanofibrous ZnO thin films. When the nano-fibrous thin films were grown on PS, their residual stress could be reduced, and the full width at half maximum (FWHM) of the ZnO (002) diffraction peak and near-band-edge emission (NBE) peak were decreased, indicating that the optical as well as the structural properties were enhanced. Furthemore, white light emission was observed from nano-fibrous ZnO thin films grown on PS.