X-ray Diffraction Patterns of Thermally-reduced Graphenes

X-ray Diffraction Patterns of Thermally-reduced Graphenes

Thermally-reduced graphenes (GPs) from graphene oxides (GOs) in the range of 200 - 800 ℃ have been investigated by using X-ray diffraction (XRD). The temperature-dependent evolutions of the (002) peaks show that exfoliation of GO sheets occurs, along with wrinkling, at ∼200 ℃ and that high-quality GPs are produced at ∼600 ℃ (GP600). These phenomena are explained by the vaporization of intercalated water molecules and the effective removal of the oxide groups of GO by thermal annealing, respectively. GP600 exhibited a clean and sharp (002) peak corresponding to an interlayer distance of 3.392 Å, which is close to that of conventional graphene (∼3.4 Å). The structure of GP600 is further discussed.

Thermally-reduced graphenes (GPs) from graphene oxides (GOs) in the range of 200 - 800 ℃ have been investigated by using X-ray diffraction (XRD). The temperature-dependent evolutions of the (002) peaks show that exfoliation of GO sheets occurs, along with wrinkling, at ∼200 ℃ and that high-quality GPs are produced at ∼600 ℃ (GP600). These phenomena are explained by the vaporization of intercalated water molecules and the effective removal of the oxide groups of GO by thermal annealing, respectively. GP600 exhibited a clean and sharp (002) peak corresponding to an interlayer distance of 3.392 Å, which is close to that of conventional graphene (∼3.4 Å). The structure of GP600 is further discussed.