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Thickness-Dependent Retention Properties in Polycrystalline Pb(Zr,Ti)O3 Capacitors Thinner than 100 nm
Thickness-Dependent Retention Properties in Polycrystalline Pb(Zr,Ti)O3 Capacitors Thinner than 100 nm
- 한국물리학회
- Journal of the Korean Physical Society
- 51(II)
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2007.1075 - 78 (4 pages)
- 0
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