Analysis of the Correlation Coefficient between Experimental Device and F RAY for Skin Elasticity

Background The elasticity of the skin can be measured using the moiré phenomenon. Moire refers to an interference pattern created when two or more periodic patterns overlap. It is possible to measure the elasticity of facial skin by measuring the height of the contour line formed by the interference pattern. Purpose To investigate the correlation between portable skin elasticity evaluation device, the Intel RealSense D435, and a reference device called full-face photographing system to assess facial skin elasticity. Study design Cross-sectional study. Methods 45 healthy adult women aged 20–59 years were recruited for this study. Contour distance of the facial area was measured using the portable skin elasticity evaluation device (PED) and full-face photographing system (FP). PED uses Intel RealSense D435 camera to measure the image. Images measured using PED and FP in a contour-type Moiré pattern were stored by the Image J program. The stored images were digitized. The results were analyzed using Pearson’s correlation analysis for correlation analysis between PED and FP. Results The contour distance measured 917.96 on the FP and 160.91 on the PED. The Pearson correlation coefficient between the contour distance of the PED and the FP was 0.6, with a significance probability of 0.002 in the statistical analysiss (p<0.05). Conclusions The analysis confirms that the PED is suitable for measuring facial skin elasticity.